首页> 外国专利> DEVICE AND METHOD FOR PREDICTING END OF LOT PROCESS OF SEMICONDUCTOR MANUFACTURING DEVICE AND MEDIUM FOR RECORDING PROGRAM FOR PREDICTING END OF LOT PROCESS

DEVICE AND METHOD FOR PREDICTING END OF LOT PROCESS OF SEMICONDUCTOR MANUFACTURING DEVICE AND MEDIUM FOR RECORDING PROGRAM FOR PREDICTING END OF LOT PROCESS

机译:预测半导体制造设备的批量生产结束的装置和方法以及用于预测批量生产结束的程序的记录介质

摘要

PPROBLEM TO BE SOLVED: To provide a device and a method for predicting the time when a lot process ends by collecting the operating states of the processing chambers of a semiconductor manufacturing device, and accurately determining a wafer conveyance path. PSOLUTION: The device comprises a first collection means for collecting the operating states of a processing chamber 101 of the semiconductor manufacturing device 3; a second collection means for collecting the number of workpieces before processing and the names of recipes; a computing means for computing the time when the lot process ends based on the results collected by the first collection means 1 and the second collection means 2; and a means for outputting the computation results. As a result, the conveyance path can be specified by collecting the usable/unusable states of the processing chamber 101 of the semiconductor manufacturing device 3, and the time when the lot process is expected to end can be predicted more accurately. PCOPYRIGHT: (C)2005,JPO&NCIPI
机译:<解决的问题:提供一种通过收集半导体制造装置的处理室的工作状态并准确地确定晶片输送路径来预测批量处理结束的时间的装置和方法。解决方案:该设备包括第一收集装置,用于收集半导体制造装置3的处理室101的操作状态;第二收集装置,用于收集加工前的工件数量和配方名称;计算装置,用于基于第一收集装置1和第二收集装置2收集的结果来计算抽签处理结束的时间;以及用于输出计算结果的装置。结果,可以通过收集半导体制造装置3的处理室101的可用/不可用状态来指定输送路径,并且可以更准确地预测批量处理预期结束的时间。

版权:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP2004310179A

    专利类型

  • 公开/公告日2004-11-04

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC IND CO LTD;

    申请/专利号JP20030099081

  • 发明设计人 SHIMIZU YUZO;

    申请日2003-04-02

  • 分类号G05B19/418;H01L21/02;H01L21/68;

  • 国家 JP

  • 入库时间 2022-08-21 23:31:44

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