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Line-to-line reliability enhancement using a dielectric liner for a low dielectric constant interlevel and intralevel (or intermetal and intrametal) dielectric layer

机译:使用介电衬里提高低介电常数层间和层内(或金属间和金属内)介电层的线到线可靠性

摘要

An embodiment of the instant invention is a method of providing a connection between a first conductor and a second conductor wherein the first conductor is situated under the second conductor and separated by a first insulating layer, the method comprising the steps of: forming an opening in the first insulating layer (layer 124 or 128 of FIGS. 1-4), the opening having a top, a bottom and sidewalls and is situated between the first conductor and the second conductor; forming a second insulating layer (layer 134, 138, and 142 of FIGS. 3 and 4) exclusively on the sidewalls of the opening thereby leaving a smaller opening in the first insulating layer; forming a conductive material (material 140 of FIGS. 3 and 4) in the smaller opening; and wherein the first insulating layer is comprised of a low-k material and the second insulating layer is comprised of an insulator which has electrical leakage properties which are less than the electrical leakage properties of the first insulating layer.
机译:本发明的一个实施例是一种在第一导体和第二导体之间提供连接的方法,其中第一导体位于第二导体下方并被第一绝缘层隔开,该方法包括以下步骤:在第一导体和第二导体之间形成开口。第一绝缘层(图 1 - 4 的层 124 128 ),开口具有顶部底部和侧壁位于第一导体和第二导体之间。仅在其上形成第二绝缘层(图 3 4 的层 134、138 142 )开口的侧壁从而在第一绝缘层中留下较小的开口;在较小的开口中形成导电材料(图 3 4 的材料 140 );其中,第一绝缘层由低k材料构成,第二绝缘层由绝缘体构成,该绝缘体的漏电特性小于第一绝缘层的漏电特性。

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