首页> 外国专利> METHOD OF APPLICATION OF DISPLACEMENT REACTION TO FORM A CONDUCTIVE CAP LAYER FOR FLIP-CHIP, COB, AND MICRO METAL BONDING

METHOD OF APPLICATION OF DISPLACEMENT REACTION TO FORM A CONDUCTIVE CAP LAYER FOR FLIP-CHIP, COB, AND MICRO METAL BONDING

机译:应用位移反应形成倒装芯片,COB和微金属结合的导电帽层的方法

摘要

A method of forming a conductive cap layer over a metal bondingpad comprises the following steps. A semiconductor structure is provided havingan exposed, recessed metal bonding pad within a layer opening. The layer has anupper surface. The exposed metal bonding pad is treated with a solution containingsoluble metal ions to form a conductive cap over the metal bonding pad. Theconductive cap layer is comprised of the solution metal and has a predeterminedthickness. An external bonding element may then be bonded to the conductive cap,forming an electrical connection with the metal bonding pad.
机译:在金属结合层上形成导电覆盖层的方法垫包括以下步骤。提供一种具有以下特征的半导体结构:层开口内的裸露的凹陷金属焊盘。该层有一个上表面。暴露的金属焊盘用含有以下物质的溶液处理:可溶性金属离子在金属焊盘上方形成导电盖。的导电盖层由溶液金属组成并且具有预定的厚度。然后可以将外部结合元件结合到导电帽,与金属焊盘形成电连接。

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