The invention relates to an arrangement for determining variations in the layer thickness of a sample (4) by means of reflectrometric interference spectroscopy, said arrangement comprising a light source (1) for illuminating the sample (4), a sample holding element (5) for fixing the sample (4), and an evaluation unit (6) for analysing the light reflected by the sample (4). One such arrangement is provided with a first light guide (7) comprising a light output surface (9) for the transmission of the light from the light source (1) to the sample (4), and with a second light guide (8) comprising a light admission surface (10) for the transmission of the light reflected by the sample (4) to the evaluation unit (6).
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