首页> 外国专利> Defect signal detecting apparatus for optical recording/reproducing apparatus and defect signal detecting method thereof

Defect signal detecting apparatus for optical recording/reproducing apparatus and defect signal detecting method thereof

机译:用于光学记录/再现设备的缺陷信号检测设备及其缺陷信号检测方法

摘要

A defect signal detecting apparatus for an optical recording/reproducing apparatus that includes a maximum value detecting unit for detecting a highest amplitude among signals input during a maximum value detection period as a maximum value, a minimum value detecting unit for detecting a lowest amplitude among signals input during a minimum value detection period as a minimum value, an asymmetry detecting unit for calculating an amount δ of asymmetry by detecting a maximum value ImaxL and a minimum value IminL of a signal IL having a maximum periodicity among the signal input, and a maximum value ImaxS and a minimum value IminS of a signal IS having a minimum periodicity among the signal input, and a defect determining unit for determining whether there is a defect in the signal input, using the maximum value, the minimum value and the amount δ of asymmetry.
机译:一种用于光学记录/再现设备的缺陷信号检测设备,包括:最大值检测单元,用于检测在最大值检测时段内输入的信号中的最大幅度作为最大值;最小值检测单元,用于检测信号中的最低幅度。在最小值检测时间段内作为最小值输入的不对称检测单元,用于通过检测在信号输入中具有最大周期性的信号IL的最大值ImaxL和最小值IminL来检测不对称量δ,并且信号IS在输入信号中具有最小周期性的ImaxS值和IminS的最小值,以及缺陷确定单元,用于使用该信号的最大值,最小值和量δ来确定信号输入中是否存在缺陷。不对称。

著录项

  • 公开/公告号EP1443502A1

    专利类型

  • 公开/公告日2004-08-04

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号EP20040001340

  • 发明设计人 RYU EUN-JIN;LEE JAE-WOOK;

    申请日2004-01-22

  • 分类号G11B7/00;

  • 国家 EP

  • 入库时间 2022-08-21 22:51:50

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