首页> 外国专利> SUBSTRATE CLEANING DEVICE AND SUBSTRATE TREATING FACILITY, ESPECIALLY CONCERNED WITH REDUCING OCCUPANCY SPACE OF THE CLEANING DEVICE

SUBSTRATE CLEANING DEVICE AND SUBSTRATE TREATING FACILITY, ESPECIALLY CONCERNED WITH REDUCING OCCUPANCY SPACE OF THE CLEANING DEVICE

机译:基质清洁设备和基质处理设备,特别是在减少清洁设备的使用空间时需要特别注意的

摘要

PURPOSE: A substrate cleaning device and a substrate treating facility are provided to supply at least two cleaning chambers including cleaning portions for cleaning the surface of a substrate, while the cleaning chambers are vertically laminated while being partially overlapped with each other, thereby reducing an occupancy size of the cleaning device. CONSTITUTION: An upper side of a base(11) is in horizontal oblong shape. A top space of the base(11), which is surrounded by a sidewall, is in hollow oblong prism shape. The oblong prism part is divided into an upper cleaning chamber(13) and a lower cleaning chamber(14). The upper cleaning chamber(13) and the lower cleaning chamber(14) are vertically laminated without being crossed in horizontal direction. The vertically laminated upper cleaning chamber(13) and the lower cleaning chamber(14) are controlled to form an area where images of the chambers are overlapped on a plane thereof to the maximum.
机译:目的:提供一种基板清洁装置和基板处理设备,以提供至少两个清洁室,所述清洁室包括用于清洁基板表面的清洁部,同时所述清洁室被竖直层压而彼此部分重叠,从而减小了占用率。清洁装置的尺寸。组成:底座(11)的上侧为水平长方形。基座(11)的被侧壁包围的顶部空间是中空的长方形棱柱形状。长方形的棱镜部分分为上清洁室(13)和下清洁室(14)。上清洁室(13)和下清洁室(14)在垂直方向上层叠而没有在水平方向上交叉。控制垂直层叠的上部清洁室(13)和下部清洁室(14),以形成使室的图像在其平面上最大程度地重叠的区域。

著录项

  • 公开/公告号KR20040067974A

    专利类型

  • 公开/公告日2004-07-30

    原文格式PDF

  • 申请/专利权人 SHARP CORPORATION;

    申请/专利号KR20040003970

  • 发明设计人 YOSHIZAWA TAKENORI;

    申请日2004-01-19

  • 分类号G02F1/13;

  • 国家 KR

  • 入库时间 2022-08-21 22:48:22

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号