首页> 外国专利> BURN-IN/FINAL TEST METHOD FOR IMPROVING YIELD OF HARD DISK DRIVE FABRICATION PROCESS

BURN-IN/FINAL TEST METHOD FOR IMPROVING YIELD OF HARD DISK DRIVE FABRICATION PROCESS

机译:改善硬盘驱动器制造过程产量的内置/最终测试方法

摘要

PURPOSE: A burn-in/final test method for improving the yield of an HDD(Hard Disk Drive) fabrication process is provided to simultaneously perform a burn-in test process for previously searching a defect to avoid the defect and a final test process for confirming whether an HDD set is normally processed without a defect, thereby improving the yield of an HDD fabrication process. CONSTITUTION: When burn-in and final test commands are received, plural test computers perform burn-in tests for a plurality of HDDs(700). A host computer detects whether the burn-in tests of the test computers are completed(710). If so, the host computer receives burn-in test results on the HDDs from the test computers to store the results, and outputs result values to a display(720,730). The host computer generates a control command for a final test of testing a defect processing state(740). The host computer detects whether the test computers complete the final test(750). If so, the host computer receives final test results to store the results, and outputs result values to the display(760,770).
机译:目的:提供一种用于提高HDD(硬盘驱动器)制造工艺成品率的老化/最终测试方法,以便同时执行老化测试过程以预先搜索缺陷以避免缺陷,并最终进行测试。确认HDD装置是否正常加工而没有缺陷,从而提高了HDD制造工艺的产量。组成:当收到老化测试和最终测试命令时,多台测试计算机将对多个HDD(700)进行老化测试。主机检测测试计算机的老化测试是否完成(710)。如果是这样,则主机计算机从测试计算机接收HDD上的老化测试结果以存储结果,并将结果值输出到显示器(720,730)。主机生成用于测试缺陷处理状态的最终测试的控制命令(740)。主机检测测试计算机是否完成了最终测试(750)。如果是这样,则主机接收最终测试结果以存储结果,并将结果值输出到显示器(760,770)。

著录项

  • 公开/公告号KR100422426B1

    专利类型

  • 公开/公告日2004-03-02

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR19960054489

  • 发明设计人 LEE JE RYONG;

    申请日1996-11-15

  • 分类号G11B21/02;

  • 国家 KR

  • 入库时间 2022-08-21 22:47:25

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