METHOD FOR INSPECTING SUBSTRATE FOR OPTOELECTRONIC DEVICE, METHOD FOR MANUFACTURING SUBSTRATE FOR OPTOELECTRONIC DEVICE, SUBSTRATE FOR OPTOELECTRONIC DEVICE, OPTOELECTRONIC DEVICE AND ELECTRONIC APPLIANCE

摘要

PROBLEM TO BE SOLVED: To provide a method for inspecting a substrate for an optoelectronic device by which physical properties of a transparent electrode in a non-flat part of a glass substrate including a protective film can be inspected in a manufacturing stage and excellent long-term reliability is obtained, to provide a method for manufacturing a substrate, and to provide an optoelectronic device and an electronic appliance.;SOLUTION: The method for inspecting a substrate for an optoelectronic device aims to evaluate physical properties of a transparent electrode formed on a the substrate for an optoelectronic device. The method includes: a transparent electrode forming step to form a transparent electrode 19 on a glass substrate including a protective film 215 formed in a portion corresponding to a display region on a glass substrate 13; and an evaluation step to evaluate the physical properties of a transparent electrode in a non-flat part 80 of the glass substrate 13 including a protective film 215 as well as to carry out an alkali acceleration test by using an alkali solution 90.;COPYRIGHT: (C)2005,JPO&NCIPI