首页> 外国专利> FAILURE DETECTION SIMULATION SYSTEM FOR ANALOG CIRCUIT

FAILURE DETECTION SIMULATION SYSTEM FOR ANALOG CIRCUIT

机译:模拟电路的故障检测仿真系统

摘要

PROBLEM TO BE SOLVED: To provide a failure detection simulation system for an analog circuit, which allows consideration as to what test conditions are appropriate for detecting failures in the elements of an analog circuit.;SOLUTION: The failure detection simulation system for detecting a failure in an analog circuit includes failure model parameters, showing the characteristics of the failure conditions for elements included in a net list 20, representing the analog circuit. The failure rate for each element is calculated, by applying the failure model parameters to each element and executing a circuit simulation, with preset expected values for the input and the output set as the test conditions.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种用于模拟电路的故障检测仿真系统,该系统可以考虑哪些测试条件适合于检测模拟电路的元件中的故障。;解决方案:用于检测故障的故障检测仿真系统模拟电路中的“故障”参数包括故障模型参数,其示出了代表模拟电路的网表20中所包括的元件的故障条件的特性。通过将故障模型参数应用于每个元素并执行电路仿真,并将输入和输出的预设期望值设置为测试条件,可以计算每个元素的失效率。COPYRIGHT:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP2005164373A

    专利类型

  • 公开/公告日2005-06-23

    原文格式PDF

  • 申请/专利权人 NEC ELECTRONICS CORP;

    申请/专利号JP20030403045

  • 发明设计人 MATSUURA TOSHIMASA;

    申请日2003-12-02

  • 分类号G01R31/28;G01R31/316;

  • 国家 JP

  • 入库时间 2022-08-21 22:34:56

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号