首页> 外国专利> Photoresist monomer and method of manufacturing the same, and a method for manufacturing photoresist copolymer, photoresist composition, photo-resist pattern forming method

Photoresist monomer and method of manufacturing the same, and a method for manufacturing photoresist copolymer, photoresist composition, photo-resist pattern forming method

机译:光致抗蚀剂单体及其制造方法,光致抗蚀剂共聚物的制造方法,光致抗蚀剂组合物,光致抗蚀剂图案形成方法

摘要

The present invention provides novel bicyclic photoresist monomers, and photoresist copolymer derived from the same. The bicyclic photoresist monomers of the present invention comprise both amine functional group and acid labile protecting group, and are represented by the formula: where m, n, R, V and B are those defined herein. The photoresist composition comprising the photoresist copolymer of the present invention has excellent etching resistance and heat resistance, and remarkably enhanced PED stability (post exposure delay stability).
机译:本发明提供了新颖的双环光致抗蚀剂单体和由其衍生的光致抗蚀剂共聚物。本发明的双环光致抗蚀剂单体同时包含胺官能团和酸不稳定的保护基,并由下式表示:其中m,n,R,V和B是本文所定义的那些。包含本发明的光致抗蚀剂共聚物的光致抗蚀剂组合物具有优异的耐蚀刻性和耐热性,并且显着提高了PED稳定性(曝光后延迟稳定性)。

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