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Photoresist monomer and method of manufacturing the same, and a method for manufacturing photoresist copolymer, photoresist composition, photo-resist pattern forming method
Photoresist monomer and method of manufacturing the same, and a method for manufacturing photoresist copolymer, photoresist composition, photo-resist pattern forming method
The present invention provides novel bicyclic photoresist monomers, and photoresist copolymer derived from the same. The bicyclic photoresist monomers of the present invention comprise both amine functional group and acid labile protecting group, and are represented by the formula: where m, n, R, V and B are those defined herein. The photoresist composition comprising the photoresist copolymer of the present invention has excellent etching resistance and heat resistance, and remarkably enhanced PED stability (post exposure delay stability).
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