首页> 外国专利> APPARATUS AND METHOD FOR IDENTIFYING POSSIBLE DEFECT INDICATORS FOR A VALVE BY USING WAVELET DECOMPOSITION

APPARATUS AND METHOD FOR IDENTIFYING POSSIBLE DEFECT INDICATORS FOR A VALVE BY USING WAVELET DECOMPOSITION

机译:利用小波分解识别阀门可能的缺陷指标的装置和方法

摘要

A method and an apparatus are provided for identifying possible indicators of a defective valve. The method and the apparatus decompose a signal having a plurality of process variable measurements into a plurality of resolution levels. The process variable measurements are associated with operation of a valve. The method and the apparatus group the resolution levels into a plurality of groups. The method and the apparatus identify one or more defect indicators for at least some of the resolution levels using the groups. The one or more defect indicators are associated with a possible defect in the valve.
机译:提供了一种用于识别阀故障的可能指示器的方法和设备。该方法和设备将具有多个过程变量测量值的信号分解为多个分辨率等级。过程变量的测量值与阀门的操作有关。该方法和设备将分辨率等级分成多个组。所述方法和设备使用所述组为至少一些分辨率等级识别一个或多个缺陷指示符。一个或多个缺陷指示器与阀中可能的缺陷相关。

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