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APPARATUS AND METHOD USING WAVEFRONT PHASE MEASUREMENTS TO DETERMINE GEOMETRICAL RELATIONSHIPS

机译:使用波前相位测量确定几何关系的装置和方法

摘要

An apparatus (20) includes a microwave source (21) that produces a microwave feed beam (22), and a first pair of microwave sensors (50, 52) that each intercept and receive a portion of the microwave feed beam (22). The two microwave sensors (50, 52) are spaced apart from each other along a first-pair axis (54). A first phase-comparison device (84) has as it inputs the output signals of the two microwave sensors (50, 52), and as an output a first phase comparison of the first-sensor output signal (56) and the second-sensor output signal (58). A first geometrical calculator (110) has as an input the first phase comparison and as an output a geometrical relationship of the first-pair axis to an other feature. This geometrical relationship output may be used to generate a control signal (114) that is used to alter the geometrical relationship. There may be additional microwave sensors operating in a similar manner but spaced to provide information for other geometrical axes or allow improvements in geometrical measurements.
机译:装置(20)包括产生微波馈送束(22)的微波源(21)和第一对微波传感器(50、52),第一对微波传感器(50、52)各自拦截并接收微波馈送束(22)的一部分。两个微波传感器(50、52)沿着第一对轴线(54)彼此间隔开。第一相位比较装置(84)输入两个微波传感器(50、52)的输出信号,并且将第一传感器输出信号(56)和第二传感器的第一相位比较作为输出。输出信号(58)。第一几何计算器(110)具有第一相位比较的输入和作为输出的第一对轴与另一特征的几何关系。该几何关系输出可以用于生成控制信号(114),该控制信号用于改变几何关系。可能存在其他微波传感器,它们以类似的方式工作,但间隔开以便为其他几何轴提供信息或允许改进几何尺寸。

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