首页> 外国专利> METHOD AND INSTRUMENT FOR MEASURING HIGH-FREQUENCY ELECTRIC CHARACTERISTIC OF ELECTRONIC COMPONENT, AND METHOD FOR CALIBRATING HIGH-FREQUENCY ELECTRICAL CHARACTERISTIC MEASURING INSTRUMENT

METHOD AND INSTRUMENT FOR MEASURING HIGH-FREQUENCY ELECTRIC CHARACTERISTIC OF ELECTRONIC COMPONENT, AND METHOD FOR CALIBRATING HIGH-FREQUENCY ELECTRICAL CHARACTERISTIC MEASURING INSTRUMENT

机译:电子元件的高频电特性的测量方法及仪器,以及高频电子特性的测量仪器的校正方法

摘要

A signal conductor (12a) having one open end and a ground conductor (12b) are connected to respective measuring ports of a measuring instrument (20). At least at three points of the signal conductor (12a) in the longitudinal direction, a short-circuit reference (10) is connected between the signal conductor (12a) and the ground conductor (12b) and electrical characteristics are measured in order to calculate the error factor of the measuring system including the transmission line. An electronic component (17) to be measured is connected between the signal conductor (12a) and the ground conductor (12b) and electrical characteristics are measured. The error factor of the measuring system is removed from the measurements of the electronic component (17), thus determining the true values of the electrical characteristics of the electronic component (17). A high-precision high-frequency electrical characteristic measuring method by reflection technique insusceptible to variation in connection can thereby be realized.
机译:具有一个开口端的信号导体(12a)和接地导体(12b)连接到测量仪器(20)的各个测量端口。在信号导体(12a)的至少纵向上的三个点处,短路基准(10)连接在信号导体(12a)和接地导体(12b)之间,并且测量电特性以便计算测量系统的误差因子,包括传输线。在信号导体(12a)与接地导体(12b)之间连接有被测定的电子部件(17),并测定了电气特性。从电子部件(17)的测量中去除测量系统的误差因子,从而确定电子部件(17)的电气特性的真实值。从而可以实现通过反射技术进行的高精度的高频电特性测量方法,该反射技术对连接的变化不敏感。

著录项

  • 公开/公告号WO2005101035A1

    专利类型

  • 公开/公告日2005-10-27

    原文格式PDF

  • 申请/专利权人 MURATA MANUFACTURING CO.LTD.;KAMITANI GAKU;

    申请/专利号WO2004JP19087

  • 发明设计人 KAMITANI GAKU;

    申请日2004-12-21

  • 分类号G01R27/26;G01R27/28;

  • 国家 WO

  • 入库时间 2022-08-21 22:08:13

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