首页> 外国专利> METHOD AND INSTRUMENT FOR MEASURING HIGH-FREQUENCY ELECTRIC CHARACTERISTIC OF ELECTRONIC COMPONENT, AND METHOD FOR CALIBRATING HIGH-FREQUENCY ELECTRICAL CHARACTERISTIC MEASURING INSTRUMENT

METHOD AND INSTRUMENT FOR MEASURING HIGH-FREQUENCY ELECTRIC CHARACTERISTIC OF ELECTRONIC COMPONENT, AND METHOD FOR CALIBRATING HIGH-FREQUENCY ELECTRICAL CHARACTERISTIC MEASURING INSTRUMENT

机译:电子元件的高频电特性的测量方法及仪器,以及高频电子特性的测量仪器的校正方法

摘要

A plurality of signal conductors (12a, 12b) and a ground conductor (12c) are connected to respective measuring ports of a network analyzer (20). At least at three points of each signal conductor (12a, 12b) specified in the longitudinal direction, a short-circuit reference (10) is connected between the signal conductors (12a, 12b) and the ground conductor (12c) and electrical characteristics are measured. A through chip (13) is connected in series between the signal conductors (12a, 12b) and electrical characteristics are measured in order to calculate an error factor of the measuring system including the transmission line. An electronic component (17) to be measured is connected between the signal conductors or between the signal conductors and the ground conductor and electrical characteristics are measured. The error factor of the measuring system is removed from the measurements of the electronic component (17), thus determining the true values of the electrical characteristics of the electronic component (17). A high-precision high-frequency electrical characteristic measuring method insusceptible to variation in connection can thereby be realized.
机译:多个信号导体(12a,12b)和接地导体(12c)连接到网络分析仪(20)的各个测量端口。每个信号导体(12a,12b)至少在纵向方向上的三个点处,短路基准(10)连接在信号导体(12a,12b)和接地导体(12c)之间,电气特性为测量。贯通芯片(13)串联连接在信号导体(12a,12b)之间,并测量电特性,以计算包括传输线的测量系统的误差因子。在信号导体之间或在信号导体与接地导体之间连接有待测量的电子部件(17),并测量了电特性。从电子部件(17)的测量中去除测量系统的误差因子,从而确定电子部件(17)的电气特性的真实值。从而可以实现一种不受连接变化影响的高精度高频电特性测量方法。

著录项

  • 公开/公告号WO2005101034A1

    专利类型

  • 公开/公告日2005-10-27

    原文格式PDF

  • 申请/专利权人 MURATA MANUFACTURING CO. LTD.;KAMITANI GAKU;

    申请/专利号WO2004JP19086

  • 发明设计人 KAMITANI GAKU;

    申请日2004-12-21

  • 分类号G01R27/26;G01R27/28;

  • 国家 WO

  • 入库时间 2022-08-21 22:08:13

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号