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METHOD FOR DEPOSITING ZINC OXIDE LAYER ON SILICON OR SAPPIRE BY ATOMIC LAYER DEPOSITION

机译:用原子层沉积法在硅或蓝宝石上沉积氧化锌层的方法

摘要

The present invention relates to a deposition method ZnO film on a silicon or sapphire substrate according to the ALE, in the deposition method ZnO film on a silicon or sapphire substrate by specifically ALE, by performing the ECR plasma pre-treatment before the ZnO film coating according to the ALE substrate It relates to a method of depositing ZnO film comprising cares for the cleaning.; By performing the oxygen, hydrogen or argon ECR plasma pre-treatment before the ZnO coating in the present invention, it is possible to reduce the initial occurrence ZnO film grown incubation period of which has, in particular by performing the oxygen ECR plasma pre-treatment, to increase the hydroxyl group density on the substrate surface film it is possible to further improve the growth.
机译:本发明涉及一种根据ALE的在硅或蓝宝石衬底上的沉积方法ZnO膜,特别是在通过ALE在硅或蓝宝石衬底上的沉积方法ZnO膜,通过在涂覆ZnO膜之前进行ECR等离子体预处理根据ALE衬底,其涉及一种沉积ZnO膜的方法,该方法包括用于清洁的护理。通过在本发明的ZnO涂层之前进行氧,氢或氩ECR等离子体预处理,特别是通过进行氧ECR等离子体预处理,可以减少其生长潜伏期的最初出现的ZnO膜。为了增加基板表面膜上的羟基密度,可以进一步改善生长。

著录项

  • 公开/公告号KR20050092505A

    专利类型

  • 公开/公告日2005-09-22

    原文格式PDF

  • 申请/专利权人 INHA-INDUSTRY PARTNERSHIP INSTITUTE;

    申请/专利号KR20040017570

  • 发明设计人 LEE CHONG MU;LIM JONG MIN;

    申请日2004-03-16

  • 分类号C23C16/44;

  • 国家 KR

  • 入库时间 2022-08-21 22:04:33

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