首页> 外国专利> Defect test method and apparatus for gray-tone mask, and defect test method and apparatus for photo mask

Defect test method and apparatus for gray-tone mask, and defect test method and apparatus for photo mask

机译:灰阶掩模的缺陷测试方法和装置以及光掩模的缺陷测试方法和装置

摘要

The present invention provides a method capable of performing a transmission assurance in gray tonbu of the gray-tone mask defect inspection and defect inspection apparatus. Gray tone with the present invention, the light-shielding portion, the gray tone as to adjust the transmission portion and the transmission amount region to reduce the light transmission amount which passes through the zone for the purpose of selectively changing the thickness of which the photoresist exposed through the area parts as a defect inspection method for a mask, to obtain the transmission signal in the gray tonbu; And a check step on the basis of the defect threshold been set with respect to the transmission signal, the gray tonbu has a step of detecting a fault the gray-tone portion; Including inspection is a defect in the gray tone mask.
机译:本发明提供了一种能够在灰阶掩模缺陷检查和缺陷检查设备的灰色tonbu中执行传输保证的方法。本发明的灰阶,遮光部,用于调整透射部的灰阶,以及透射量区域以减小穿过该区域的光透射量,以选择性地改变光刻胶的厚度。作为掩模的缺陷检查方法,通过区域部分进行曝光,从而获得灰色tonbu中的透射信号。并且,基于缺陷阈值对发送信号设定检查步骤,灰色tonbu具有检测灰阶部分的故障的步骤。包括检查在内,是灰色调掩膜中的缺陷。

著录项

  • 公开/公告号KR100482793B1

    专利类型

  • 公开/公告日2005-04-19

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20010061014

  • 发明设计人 나카니시카주히코;

    申请日2001-09-29

  • 分类号G02F1/13;

  • 国家 KR

  • 入库时间 2022-08-21 22:03:58

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