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Uniform irradiation method and rig for neutron transmutation doping of silicon

机译:硅中子trans变掺杂的均匀辐照方法和装置

摘要

The present invention relates to a neutron irradiation method for a single crystal doped with the doping of the silicon single crystal with neutrons, and more particularly to a uniform irradiation of the silicon neutron doping the outer surface of the single crystal the neutron through the thickness control of water and air, until a uniform irradiation It relates to a method.; This method is rotated after the input single crystal reflector is disposed vertically to the inside of the investigation hole provided in the reflector tank of research reactors, in the longitudinal direction and radial direction in a manner such that the neutron irradiation of neutron doping is irradiated; The top and bottom in a radial direction of the single crystal, the amount of irradiation of neutrons emitted in the longitudinal direction and radial direction of the single crystal through the formation of an air layer, and then there is formed a water layer center part, enclosing the single crystal has a thickness control of the water layer and the air layer this is to ensure uniform.; By providing a uniform irradiation method as described above, it is possible to facilitate the control of the neutron dose required in the single crystal, by controlling the thickness of water to reduce the loss of neutrons has an effect of increasing the doping capacity.
机译:本发明涉及一种用中子掺杂硅单晶的单晶的中子辐照方法,更具体地说,涉及通过厚度控制掺杂中子单晶外表面的硅中子的均匀辐照。本发明涉及一种水和空气,直到均匀照射。在将输入的单晶反射器相对于设置在研究反应堆的反射器槽内的检查孔的内部垂直地配置在长度方向和径向上之后,以照射中子掺杂的中子辐射的方式旋转。通过形成空气层,在单晶的径向的顶部和底部,在单晶的长度方向和径向上发射的中子的照射量,然后形成水层的中央部,封闭单晶具有水层和空气层的厚度控制,以确保均匀。通过提供如上所述的均匀照射方法,可以通过控制水的厚度以减少中子的损失来促进单晶中所需的中子剂量的控制,从而具有增加掺杂能力的效果。

著录项

  • 公开/公告号KR100517668B1

    专利类型

  • 公开/公告日2005-09-28

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20030070683

  • 申请日2003-10-10

  • 分类号H01L21/265;

  • 国家 KR

  • 入库时间 2022-08-21 22:03:22

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