首页> 外国专利> COMPLEMENTARY METAL OXIDE SEMICONDUCTOR THIN-FILM TRANSISTOR COMPRISING COMMON GATE, LOGIC DEVICE COMPRISING IT, AND METHOD OF MANUFACTURING TRANSISTOR

COMPLEMENTARY METAL OXIDE SEMICONDUCTOR THIN-FILM TRANSISTOR COMPRISING COMMON GATE, LOGIC DEVICE COMPRISING IT, AND METHOD OF MANUFACTURING TRANSISTOR

机译:包含公共栅极的互补金属氧化物半导体薄膜晶体管,包括它的逻辑器件以及制造晶体管的方法

摘要

PPROBLEM TO BE SOLVED: To provide a complementary metal oxide semiconductor transistor comprising a common gate, a logic device comprising it, and a method of manufacturing the transistor. PSOLUTION: The CMOS thin film transistor includes a base substrate and a silicon layer of predetermined form formed on the base substrate. A P-channel transistor is formed on the silicon layer, and a N-channel transistor sharing a gate is formed to intersect each other. A Schottky barrier inducing material layer is formed on the surface of the source and the drain of any one selected out of the P-channel transistor and the N-channel transistor. PCOPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供包括公共栅极的互补金属氧化物半导体晶体管,包括公共栅极的逻辑器件以及制造该晶体管的方法。

解决方案:CMOS薄膜晶体管包括基底基板和在基底基板上形成的预定形式的硅层。在硅层上形成P沟道晶体管,并且形成共享栅极的N沟道晶体管以彼此相交。在从P沟道晶体管和N沟道晶体管中选出的任一个的源极和漏极的表面上形成肖特基势垒诱导材料层。

版权:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006173632A

    专利类型

  • 公开/公告日2006-06-29

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO LTD;

    申请/专利号JP20050363710

  • 申请日2005-12-16

  • 分类号H01L29/786;H01L27/08;H01L21/8238;H01L27/092;H01L29/872;H01L29/47;H01L29/423;H01L29/49;H01L21/28;H01L29/417;

  • 国家 JP

  • 入库时间 2022-08-21 21:52:52

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