首页> 外国专利> MICROSCOPIC INSPECTION APPARATUS, MICROSCOPIC INSPECTION SYSTEM AND MICROWELL PLATE TRANSFER DEVICE

MICROSCOPIC INSPECTION APPARATUS, MICROSCOPIC INSPECTION SYSTEM AND MICROWELL PLATE TRANSFER DEVICE

机译:显微检查装置,显微检查系统和微孔板转移装置

摘要

PROBLEM TO BE SOLVED: To provide a microscopic inspection apparatus capable of successively and efficiently inspecting a number of samples.;SOLUTION: The microscopic inspection apparatus 100 is equipped with a cassette 102 which can house a plurality of sheets of samples 101, an elevator to vertically move the cassette 102, a microscope 132 to enlarge and observe a sample 101, an XY stage 105 to appropriately place the sample 101 in an observation position, and a carrying device 104 to carry the sample 101 between the cassette 102 and the XY stage 105. The carrying device 104 is equipped with a holding part to hold a sample 101, a horizontal moving mechanism to horizontally move the holding part, and a lifting mechanism to move up and down the holding part, and a rotating mechanism to rotate the holding part. The XY stage 105 has an upper table 119 which can move in the X direction, and a sample 101 is mounted on the upper table 119. The upper table 119 has an opening 128 where a fork portion 117 of the carrying device 104 passes up and down.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种能够连续且有效地检查多个样本的显微镜检查装置。解决方案:显微镜检查装置100配备有可容纳多张样本101的盒102,以及用于检查样品的电梯。垂直移动盒102,显微镜132以放大并观察样品101,XY台105以将样品101适当地放置在观察位置,以及运送装置104以在盒102和XY台之间运送样品101 105.搬运装置104具备:用于保持样本101的保持部;使该保持部水平移动的水平移动机构;使该保持部上下移动的升降机构;以及使保持部旋转的旋转机构。部分。 XY载物台105具有能够沿X方向移动的上工作台119,在上工作台119上载置有样品101。上工作台119具有开口128,搬运装置104的叉部117从该开口128向上穿过。 down。; COPYRIGHT:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006064850A

    专利类型

  • 公开/公告日2006-03-09

    原文格式PDF

  • 申请/专利权人 OLYMPUS CORP;

    申请/专利号JP20040245313

  • 发明设计人 TSUCHISAKA SHINICHI;SUZUKI MOTOHIKO;

    申请日2004-08-25

  • 分类号G02B21/32;C12M1/00;C12M1/34;G01N1/00;

  • 国家 JP

  • 入库时间 2022-08-21 21:51:00

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