首页> 外国专利> A wire bonding method, a semiconductor mounting method using the wire bonding method, a wire bonding apparatus, and a semiconductor mounting apparatus including the wire bonding apparatus.

A wire bonding method, a semiconductor mounting method using the wire bonding method, a wire bonding apparatus, and a semiconductor mounting apparatus including the wire bonding apparatus.

机译:引线键合方法,使用该引线键合方法的半导体安装方法,引线键合装置以及包括该引线键合装置的半导体安装装置。

摘要

PROBLEM TO BE SOLVED: To obtain method and apparatus for mounting a semiconductor in which the connecting failure of bonding or the disconnection of a wire can simply be identified at the time of wire bonding. SOLUTION: The method for mounting a semiconductor including wire bonding and the apparatus for mounting the semiconductor comprise a clamper 5 mounted at a bonding arm 1 and a bonding pressurizing tool 4, and the steps of measuring the tension of a wire 7 held at the clamper 5 after bonding by driving means 3 according to the current flowing to the motor of the means 3, and discriminating between right and wrong of the bonding according to the measured value.
机译:解决的问题:获得一种用于安装半导体的方法和装置,其中可以在引线键合时简单地识别键合的连接失败或引线的断开。解决方案:用于安装包括引线键合的半导体的方法和用于安装半导体的设备包括:安装在键合臂1上的夹具5和键合加压工具4;以及测量保持在夹具上的导线7的张力的步骤如图5所示,在通过驱动装置3进行键合之后,根据流向装置3的电动机的电流,并根据测量值来区分键合的对与错。

著录项

  • 公开/公告号JP3724875B2

    专利类型

  • 公开/公告日2005-12-07

    原文格式PDF

  • 申请/专利权人 松下電器産業株式会社;

    申请/专利号JP19960104422

  • 发明设计人 永井 禎之;江口 信三;

    申请日1996-03-29

  • 分类号H01L21/60;

  • 国家 JP

  • 入库时间 2022-08-21 21:48:36

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