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Ultrasonic power features of wire bonding and thermosonic flip chip bonding in microelectronics packaging

机译:微电子封装中引线键合和热超声倒装芯片键合的超声功率特性

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摘要

The driving voltage and current signals of piezoeeramie transducer (PZT) were measured directly by designing circuits from ultrasonic generator and using a data acquisition software system. The input impedance and power of PZT were investigated by using root mean square (RMS) calculation. The vibration driven by high frequency was tested by laser Doppler vibrometer (PSV-400-M2). And the thermosonic bonding features were observed by scanning electron microscope (JSM-6360LV). The results show that the input power of bonding is lower than that of no load. The input impedance of bonding is greater than that of no load.Nonlinear phase, plastic flow and expansion period, and strengthening bonding process are shown in the impedance and power curves. The ultrasonic power is in direct proportion to the vibration displacement driven by the power, and greater displacements driven by high power (5W) result in welding failure phenomena, such as crack, break, and peeling off in wedge bonding. For thermosonic flip chip bonding, the high power decreases position precision of bonding or results in slippage and rotation phenomena of bumps. To improve reliability and precision of thermosonic bonding, the low ultrasonic power (about 1-5W) should be chosen.
机译:压电式换能器(PZT)的驱动电压和电流信号是通过设计超声波发生器的电路并使用数据采集软件系统直接测量的。通过使用均方根(RMS)计算来研究PZT的输入阻抗和功率。高频驱动的振动通过激光多普勒振动计(PSV-400-M2)进行了测试。并通过扫描电子显微镜(JSM-6360LV)观察了热超声键合特征。结果表明,键合的输入功率低于空载。键合的输入阻抗大于空载。阻抗和功率曲线显示了非线性相,塑性流动和膨胀周期以及强化键合过程。超声功率与功率驱动的振动位移成正比,而高功率(5W)驱动的更大位移会导致焊接失败现象,例如裂纹,断裂和楔焊时剥离。对于热超声倒装芯片键合,高功率会降低键合的位置精度,或导致凸点的滑动和旋转现象。为了提高热超声键合的可靠性和精度,应选择低超声功率(约1-5W)。

著录项

  • 来源
    《中南大学学报(英文版)》 |2008年第5期|684-688|共5页
  • 作者

    LI Jun-hui; HAN Lei; ZHONG Jue;

  • 作者单位

    School of Mechanical and Electronical Engineering, Central South University, Changsha 410083, China;

    Key Laboratory of Modem Complex Equipment Design and Extreme Manufacturing of Ministry of Education,Changsha 410083, China;

    State Key Laboratory of Digital Manufacturing Equipment and Technology,Huazhong University Science and Technology, Wuhan 430074, China;

    School of Mechanical and Electronical Engineering, Central South University, Changsha 410083, China;

    Key Laboratory of Modem Complex Equipment Design and Extreme Manufacturing of Ministry of Education,Changsha 410083, China;

    School of Mechanical and Electronical Engineering, Central South University, Changsha 410083, China;

    Key Laboratory of Modem Complex Equipment Design and Extreme Manufacturing of Ministry of Education,Changsha 410083, China;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 chi
  • 中图分类 物理学;
  • 关键词

    ultrasonic power; wedge bonding; thermosonic flip chip; input impedance; failure;

    机译:超声波功率;楔焊;热电倒装芯片;输入阻抗;故障;
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