首页> 外国专利> Method for depositing a metal gate on a high-k dielectric film and improving high-k dielectric film and metal gate interface, and a substrate treating system

Method for depositing a metal gate on a high-k dielectric film and improving high-k dielectric film and metal gate interface, and a substrate treating system

机译:在高k介电膜上沉积金属栅极并改善高k介电膜和金属栅界面的方法以及基板处理系统

摘要

A method to improve a high-k dielectric film and metal gate interface in the fabrication of a MOSFET by depositing a metal gate on a high-k dielectric, the method includes annealing a substrate with a high-k dielectric film deposited thereon in a thermal annealing module and depositing a metal gate material on the annealed substrate in a metal gate deposition module, wherein the annealing step and the depositing step are carried out consecutively without a vacuum break.
机译:一种通过在高k电介质上沉积金属栅极来改善MOSFET制造中的高k电介质膜和金属栅极界面的方法,该方法包括通过热退火将其上沉积有高k电介质膜的衬底退火退火模块和在金属栅极沉积模块中在退火的基板上沉积金属栅极材料的方法,其中退火步骤和沉积步骤是连续进行的,不会发生真空破坏。

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