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SRAM type memory element, memory comprising such a memory element, associated reading method and writing method

机译:SRAM型存储元件,包括这种存储元件的存储器,相关的读取方法和写入方法

摘要

The unit has a reference transistor (TC) with a drain coupled to a node (A) and a source coupled to a reference line (BLREF). A cut off potential (GND) is applied to a gate of the transistor (TC). An access transistor (TB), coupled to the transistor (TC), has a drain coupled to a node (B), a gate coupled to a word line (WL), and a source coupled to a write line (BL) on which a write potential is applied. Independent claims are also included for the following: (A) a memory comprising a set of memory units (B) a method of reading a memory unit.
机译:该单元具有参考晶体管(TC),其漏极耦合到节点(A),源极耦合到参考线(BLREF)。截止电位(GND)被施加到晶体管(TC)的栅极。耦合到晶体管(TC)的存取晶体管(TB)具有耦合到节点(B)的漏极,耦合到字线(WL)的栅极和耦合到写线(BL)的源极。施加写电位。还包括以下方面的独立权利要求:(A)包括一组存储单元的存储器(B)读取存储单元的方法。

著录项

  • 公开/公告号EP1624460A2

    专利类型

  • 公开/公告日2006-02-08

    原文格式PDF

  • 申请/专利权人 STMICROELECTRONICS SA;

    申请/专利号EP20050366006

  • 发明设计人 GENEVAUX FRANCK;

    申请日2005-07-28

  • 分类号G11C11/41;

  • 国家 EP

  • 入库时间 2022-08-21 21:28:58

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