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WAFER RECOVERY STATION AND APPARATUS FOR FABRICATING SEMICONDUCTOR DEVICE THEREBY

机译:晶圆制造厂和设备,用于制造半导体设备

摘要

wafer recovery station apparatus for manufacturing a semiconductor device is provided. Wafer recovery station of the semiconductor device manufacturing apparatus is installed in an exposure process in which a rough wafer is loaded support , the cloth is formed so as to penetrate through the support study , vacuum line connected to the piercer to pass a predetermined vacuum pressure in drilling , the vacuum line a predetermined control signal in response to the pressure sensor , the pressure signal transmitted operation receives signals from the sensor passes a predetermined operation unit detects a change of pressure vacuum line for generating a predetermined operation signal according to whether the wafer is loaded on the support includes a controller for generating a . Further, there is provided a semiconductor device manufacturing apparatus using the same .
机译:提供了一种用于制造半导体器件的晶片回收站设备。半导体器件制造设备的晶片回收站安装在曝光过程中,在该过程中,将粗糙的晶片装载到载体中,形成布以使其穿过载体研究,连接到穿孔机的真空管线通过预定的真空压力。钻孔时,真空线响应压力传感器发出预定的控制信号,压力信号的传输操作从传感器接收到的信号通过预定的操作单元,检测压力真空线的变化,以根据晶片是否产生预定的操作信号装载在支架上的控制器用来产生一个。此外,提供了一种使用该半导体器件的半导体器件制造设备。

著录项

  • 公开/公告号KR20060041036A

    专利类型

  • 公开/公告日2006-05-11

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20040090389

  • 发明设计人 JEONG YOUNG HO;

    申请日2004-11-08

  • 分类号H01L21/68;H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 21:25:55

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