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INTEGRATED CIRCUIT TESTER WITH DISK-BASED DATA STREAMING

机译:具有基于磁盘的数据流的集成电路测试仪

摘要

An integrated circuit (IC) tester includes set of tester channels, each for carrying out a test activity at a separate terminal of an IC device under test (DUT) during each cycle of a test. The tester also includes a disk drive having a removable disk for reading out scan or programming data to the tester channels during a test. Each tester channel includes an instruction memory for storing a set of instructions, and each tester channel executes its stored instructions during the test. Some of the instructions include VECTOR data directly indicating a particular test activity the tester channel is to carry out at a DUT terminal during a next test cycle. Others of the instructions tell the tester channel to acquire a particular number (N) of serial data bits as they are read out of the disk drive and to carry out an activity during each of the next N test cycles indicated by a state of a corresponding one of the N serial data bits.
机译:集成电路(IC)测试仪包括一组测试仪通道,每个通道用于在每个测试周期内在被测IC器件(DUT)的单独端子上执行测试活动。该测试仪还包括具有可移动磁盘的磁盘驱动器,用于在测试期间将扫描或编程数据读出到测试仪通道。每个测试器通道包括用于存储一组指令的指令存储器,并且每个测试器通道在测试期间执行其存储的指令。其中一些指令包括VECTOR数据,这些数据直接指示测试仪通道在下一个测试周期内将在DUT终端上执行的特定测试活动。其他指令告诉测试器通道从磁盘驱动器中读取特定数量的串行数据位(N),并在相应状态指示的接下来的N个测试周期中的每个周期中执行活动N个串行数据位之一。

著录项

  • 公开/公告号KR100634991B1

    专利类型

  • 公开/公告日2006-10-17

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20017004134

  • 发明设计人 왓슨힐;

    申请日2001-03-30

  • 分类号G01R31/28;

  • 国家 KR

  • 入库时间 2022-08-21 21:22:49

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