首页> 外国专利> Lateral semiconductor component, such as IGBT-transistors and MOSFET and JFET, has drift regions of drift zone extending in lateral direction

Lateral semiconductor component, such as IGBT-transistors and MOSFET and JFET, has drift regions of drift zone extending in lateral direction

机译:横向半导体组件(例如IGBT晶体管,MOSFET和JFET)具有在横向方向上延伸的漂移区的漂移区

摘要

A lateral semiconductor has a semiconductor body (6) and in which under the upper face (7) is arranged a drift-region divided into low- up to medium-doped drift zones (11) of a first conductivity type. The drift regions of the drift zone (11) extend in a first lateral direction (12) and between the drift regions trench structures (16) are arranged in a first lateral direction, and their trench walls (17) have a dielectric layer, and the trenches have a dielectric high-k-material with a high relative dielectric constant and/or a plate-layer sequence as alternate electrically conducting plates (20) and inter-plates (21) of a dielectric material. An independent claim is included for a method for fabricating a semiconductor component.
机译:横向半导体具有半导体本体(6),并且在该半导体本体(6)的上表面(7)下方布置有漂移区,该漂移区被划分为第一导电类型的低至中掺杂的漂移区(11)。漂移区(11)的漂移区沿第一横向方向(12)延伸,并且在漂移区之间的沟槽结构(16)沿第一横向方向布置,并且它们的沟槽壁(17)具有介电层,并且沟槽具有介电常数高的介电高k材料和/或作为介电材料的交替导电板(20)和板间板(21)的板层序列。包括关于制造半导体部件的方法的独立权利要求。

著录项

  • 公开/公告号DE102005003127B3

    专利类型

  • 公开/公告日2006-06-14

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE20051003127

  • 发明设计人 PFIRSCH FRANK;

    申请日2005-01-21

  • 分类号H01L29/06;H01L29/861;H01L29/739;H01L29/76;H01L21/328;H01L21/334;

  • 国家 DE

  • 入库时间 2022-08-21 21:20:27

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