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Mobility enhancement by strained channel CMOSFET with single workfunction metal-gate and fabrication method thereof

机译:具有单功函数金属栅的应变沟道CMOSFET增强迁移率及其制造方法

摘要

The present invention provides a complementary metal-oxide-semiconductor (CMOS) device and a fabrication method thereof. The CMOSFET device includes a compressively strained SiGe channel for a PMOSFET, as well as a tensile strained Si channel for an NMOSFET, thereby enhancing hole and electron mobility for the PMOSFET and the NMOSFET, respectively. As such, the threshold voltages of the two types of transistors can be obtained in oppositely symmetric by single metal gate.
机译:本发明提供一种互补金属氧化物半导体(CMOS)器件及其制造方法。 CMOSFET器件包括用于PMOSFET的压缩应变SiGe沟道,以及用于NMOSFET的拉伸应变Si沟道,从而分别增强了PMOSFET和NMOSFET的空穴和电子迁移率。这样,可以通过单个金属栅极相对对称地获得两种类型的晶体管的阈值电压。

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