Semiconductor device provided with function for screening test regarding operating speed

摘要

A semiconductor device includes one or more margin detecting circuits, each of which includes a first flip-flop having a first clock signal input node coupled to a clock supply node and a first data input node coupled to a data supply node, a second flip-flop having a second clock signal input node coupled to the clock supply node and a second data input node coupled to the data supply node, a delay element situated between the clock supply node and the second clock input node or between the data supply node and the second data input node, and a check circuit configured to check whether data stored in the first flip-flop matches data stored in the second flip-flop.