Semiconductor device e.g. ROM, operating method, involves operating pin of device in normal operation mode as application-function-pin, where pin is operated in two test operating modes as test pin and application-function pin, respectively

摘要

The method involves operating one pin (9b, 9c, 9d, 9e) of a semiconductor device in a normal operation mode of the device as application-function-pin. The pin is operated in a test operating mode as test pin to input and/or output corresponding test signals. The pin is operated in another test mode as application-function pin. The pin is used in former operating mode as JTAG test pin to input and output corresponding JTAG-test-signals. An independent claim is also included for a semiconductor device having a test interface device.