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MOSFET formed on a silicon-on-insulator substrate having a SOI layer and method of manufacturing

机译:在具有SOI层的绝缘体上硅衬底上形成的MOSFET及其制造方法

摘要

In a FET having a thin-film SOI layer, to prevent a parasitic resistance increase in source/drain regions. To realize an elevated layer to be formed on the source/drain region without using a lithography process and without a fear of a short circuit. Element-isolation insulating films 7, which are taller than a semiconductor layer 3, are formed surrounding the island-shaped semiconductor layer (SOI layer) 3, while gate electrodes 5a, 8a which are taller than the element-isolation insulating films 7 are formed on the semiconductor layer 3. A polycrystalline silicon film 11 is deposited on the whole surface. elevated layers 11a, 11b which are shorter than the element-isolation insulating film 7 are formed on the source/drain regions 3a, 3b by chemical-mechanical polishing and etching back. Silicide layers 13a to 13c are formed on the gate electrode and on the elevated layers. An interlayer insulating film 14 is formed, and a metal electrode 16 is formed.
机译:在具有薄膜SOI层的FET中,为了防止源极/漏极区域中的寄生电阻增加。在不使用光刻工艺且不担心短路的情况下实现在源极/漏极区域上形成的升高层。围绕岛状半导体层(SOI层) 3 3 高的元件隔离绝缘膜 7 。 >,而栅电极 5 a, 8 a 高于元素隔离绝缘膜 3 上形成> 7 。多晶硅膜 11 沉积在整个表面上。比元件隔离绝缘膜 7 <短的凸起层 11 a, 11 b / B>通过化学机械抛光在源/漏区 3 a, 3 b 上形成回蚀。在栅电极和升高的层上形成硅化物层 13 a 13 c 。形成层间绝缘膜 14 ,并形成金属电极 16

著录项

  • 公开/公告号US7247910B2

    专利类型

  • 公开/公告日2007-07-24

    原文格式PDF

  • 申请/专利权人 JONG WOOK LEE;HISASHI TAKEMURA;

    申请/专利号US20040499224

  • 发明设计人 HISASHI TAKEMURA;JONG WOOK LEE;

    申请日2003-02-13

  • 分类号H01L27/01;

  • 国家 US

  • 入库时间 2022-08-21 21:01:57

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