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Method and apparatus for using clustering method to analyze semiconductor devices
Method and apparatus for using clustering method to analyze semiconductor devices
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机译:使用聚类方法分析半导体器件的方法和装置
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摘要
A method for analyzing a semiconductor device tests a semiconductor device to produce first and second data. A clustering method is applied to the first data, creating a clustered first data. The clustered first data is then correlated with the second data to determine analyzed data.
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