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Method for producing ZnO thin film using atomic layer deposition and annealing process

机译:利用原子层沉积和退火工艺制备ZnO薄膜的方法

摘要

The present invention relates to a method for producing a ZnO thin film using atomic layer deposition and after heat treatment step , More specifically, in the step of heat treatment after the ZnO thin film deposited by atomic layer deposition process, the crystallinity of the ZnO films by controlling the annealing atmosphere gas, and the heat treatment temperature, optical properties, electrical properties, such as improved production method of the ZnO thin film relates to. ; According to the present invention, after the ZnO thin film deposited by atomic layer deposition method which can replace the conventional GaN thin film by controlling the heat treatment process, it is possible to manufacture an excellent ZnO films. Thus, by gaining the high ground advantage in the application of technology as among various applications of ZnO light emitting device (LED), by replacing the GaN-based LED that dominates the current LED sector address the burden of hefty royalty payments, and further export increasing effect can be expected.
机译:本发明涉及一种利用原子层沉积并在热处理步骤之后制备ZnO薄膜的方法,更具体地,在通过原子层沉积法沉积ZnO薄膜之后的热处理步骤中,ZnO膜的结晶度通过控制退火气氛中的气体,以及热处理温度,光学性能,电学性能,诸如改进的ZnO薄膜的制备方法涉及。 ;根据本发明,在通过原子层沉积法沉积的ZnO薄膜可以通过控制热处理工艺来代替常规的GaN薄膜之后,可以制造出优异的ZnO薄膜。因此,通过在ZnO发光器件(LED)的各种应用中获得技术应用的高地优势,通过取代在当前LED领域占主导地位的GaN基LED解决了高额专利费的负担,并进一步出口效果会有所提高。

著录项

  • 公开/公告号KR20070021343A

    专利类型

  • 公开/公告日2007-02-23

    原文格式PDF

  • 申请/专利权人 인하대학교 산학협력단;

    申请/专利号KR20050075492

  • 发明设计人 이종무;박연규;박안나;

    申请日2005-08-18

  • 分类号H01L21/205;H01L21/324;

  • 国家 KR

  • 入库时间 2022-08-21 20:36:49

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