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THYRISTOR-TYPE ISOLATION STURCTURE OF SEMICONDUCTOR DEVICE

机译:半导体器件的晶闸管型隔离结构

摘要

Between a conductive pad to which a high frequency signal is applied and a silicon substrate, a P-type semiconductor substrate, an N well formed in the substrate, a P-type junction formed in the N well, and an N-type dopant formed on a surface of the substrate A thyristor type isolation structure including a conductive layer is disclosed. Here, the conductive layer may be formed of a polysilicon and cobalt silicide layer. Through this, it is possible to minimize the distortion and loss of the high frequency signal applied to the conductive pad using the conventional CMOS process.;PGS, isolation structure
机译:在施加了高频信号的导电焊盘与硅基板之间,P型半导体基板,在基板中形成的N阱,在N阱中形成的P型结,以及形成的N型掺杂剂之间在基板的表面上,公开了一种包括导电层的晶闸管型隔离结构。在此,导电层可以由多晶硅和硅化钴层形成。通过这种方式,可以使用传统的CMOS工艺将施加到导电焊盘上的高频信号的失真和损耗降至最低。

著录项

  • 公开/公告号KR100707594B1

    专利类型

  • 公开/公告日2007-04-06

    原文格式PDF

  • 申请/专利权人 DONGBU ELECTRONICS CO. LTD.;

    申请/专利号KR20050132710

  • 发明设计人 YOON YEO CHO;

    申请日2005-12-28

  • 分类号H01L21/76;

  • 国家 KR

  • 入库时间 2022-08-21 20:32:25

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