首页> 外国专利> MULTI-VALUED NONVOLATILE MEMORY DEVICE WITH ENHANCED RELIABILITY AND MEMORY SYSTEM HAVING THE SAME

MULTI-VALUED NONVOLATILE MEMORY DEVICE WITH ENHANCED RELIABILITY AND MEMORY SYSTEM HAVING THE SAME

机译:具有增强的可靠性的多值非易失性存储器和具有相同功能的存储器系统

摘要

A nonvolatile memory device, memory system and read method are disclosed. The memory device comprises a memory cell array comprising a plurality of memory blocks each having a plurality of memory cells adapted to store N bits, where N is an integer greater than 1, a page buffer configured to perform a read operation adapted to read data from the memory cell array and output read data, an error correction circuit configured to detect and correct an error in read data stored in a memory block K and generate corresponding error information, and a control circuit configured to reduce the number of bits stored in the plurality of memory cells for memory block K from N to J, where J is an integer less than N but greater than zero, in response to the error information.
机译:公开了一种非易失性存储装置,存储系统和读取方法。该存储器设备包括:存储器单元阵列,其包括多个存储器块,每个存储器块具有适于存储N位的多个存储器单元,其中N是大于1的整数;页缓冲器,其被配置为执行适于从存储器中读取数据的读取操作。存储器单元阵列并输出读取的数据;纠错电路,其被配置为检测并纠正存储在存储块K中的读取数据中的错误并生成相应的错误信息;以及控制电路,其被配置为减少存储在多个存储块K中的位数响应于错误信息,从N到J的存储块K的存储单元的数目为N,其中J是小于N但大于零的整数。

著录项

  • 公开/公告号KR100719380B1

    专利类型

  • 公开/公告日2007-05-18

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20060029691

  • 发明设计人 HWANG SANG WON;LEE JONG SOO;

    申请日2006-03-31

  • 分类号G11C16/22;G11C16/34;

  • 国家 KR

  • 入库时间 2022-08-21 20:32:09

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