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A method for the production of inp -, - the heterostructure bipolar transistors on the basis of iii / v - semiconductors

机译:一种基于iii / v-半导体生产inp-,-异质结构双极晶体管的方法

摘要

A process for the preparation of an indium phosphide - based heterostructure - bipolar transistor having the following method steps:(a) forming a layer sequence of a collector (1) is made of indium phosphide, a base (2) from a group iii / v - semiconductors and of an emitter (3),(b) subsequent masking a the emitter (3) overlapping region and implantation of ions in the non-masked area for the formation of an injured portion (7) of the base (2) and of the collector (1),(c) subsequent masking a part of the damaged area (7), wherein the in the process step (b) as well as a masked area to this region of adjoining part of the damaged area (7) are exposed,(d) application of a base - metallization (6) on the in the process step (c) is not masked region of the base (2), so that the base - metallization (6) the boundary region between the damaged area (7) and the damaged area overlaps,(e) subsequent masking a the emitter (3) overlapping region, and(f) removing the damaged area (7) of the base (2) and the collector..
机译:具有以下方法步骤的基于磷化铟的异质结构双极晶体管的制备方法:(a)形成集电极(1)的层序列的材料是磷化铟,基团(iii)的基极(2)/ v-半导体和发射极(3),(b)随后掩盖发射极(3)重叠区域并在非掩盖区域注入离子,以形成基底(2)的受损伤部分(7)以及收集器(1),(c)随后遮盖一部分受损区域(7),其中在处理步骤(b)中以及遮盖区域到该部分受损区域(7)的该区域)被暴露,(d)在工艺步骤(c)中施加碱-金属化层(6),而不掩盖碱(2)的区域,从而使碱-金属化层(6)之间的边界区域损坏的区域(7)和损坏的区域重叠,(e)随后遮盖发射极(3)的重叠区域,并且(f)移除基座的损坏区域(7)( 2)和收集器。

著录项

  • 公开/公告号DE10330359B4

    专利类型

  • 公开/公告日2007-02-08

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE2003130359

  • 发明设计人

    申请日2003-07-01

  • 分类号H01L21/331;H01L21/265;H01L21/306;

  • 国家 DE

  • 入库时间 2022-08-21 20:30:08

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