首页> 外国专利> A method of removing a doped surface layer on backs of crystalline silicon solar wafers

A method of removing a doped surface layer on backs of crystalline silicon solar wafers

机译:一种去除晶体硅太阳能晶片背面的掺杂表面层的方法

摘要

The invention relates to a method for the one-sided removal of a doped surface layer on rear sides of crystalline silicon solar wafers. In accordance with the object set, doped surface layers should be able to be removed from rear sides of such solar wafers in a cost-effective manner and with a handling which is gentle on the substrate. In addition, the front side should not be modified. In accordance with the invention, an etching gas is directed onto the rear side surface of silicon solar wafers with a plasma atmospheric pressure.
机译:本发明涉及一种用于单侧去除晶体硅太阳能晶片背面上的掺杂表面层的方法。根据所设定的目的,掺杂的表面层应该能够以成本有效的方式并通过在基板上平缓的处理而从这种太阳能晶片的背面去除。此外,不应修改正面。根据本发明,在等离子大气压下将蚀刻气体引导到硅太阳能晶片的后侧表面上。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号