首页> 外国专利> Process involving formation of contact hole in intermediate layer of dielectric material to obtain connection to contact region of switching element useful in semiconductor production, especially for deposition of thin barrier layer

Process involving formation of contact hole in intermediate layer of dielectric material to obtain connection to contact region of switching element useful in semiconductor production, especially for deposition of thin barrier layer

机译:涉及在介电材料的中间层中形成接触孔以获得与开关元件的接触区域的连接的工艺,该开关元件可用于半导体生产,尤其是用于薄阻挡层的沉积

摘要

Process involving formation of contact hole in an intermediate layer of dielectric material to obtain a connection to the contact region of a switching element, deposition of Ti-based barrier layer in a contact hole and redistribution of the barrier layer material from the lower side of the contact hole to a lower side wall region by directed sputtering of an inert material on the base.
机译:此过程包括在介电材料的中间层中形成接触孔以获得与开关元件接触区域的连接,在接触孔中沉积Ti基势垒层以及从势垒层的下侧重新分配势垒层材料的过程通过将惰性材料定向溅射到基底上,将接触孔连接到下侧壁区域。

著录项

  • 公开/公告号DE102005046976A1

    专利类型

  • 公开/公告日2007-04-05

    原文格式PDF

  • 申请/专利权人 ADVANCED MICRO DEVICES INC.;

    申请/专利号DE20051046976

  • 发明设计人 FROHBERG KAI;HUY KATYA;KAHLERT VOLKER;

    申请日2005-09-30

  • 分类号C23C14/34;C23C14/06;C23C14/14;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:43

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