首页> 外国专利> METHOD FOR PRODUCING SAMPLE NUCLEIC ACID FOR ANALYZING NUCLEIC ACID MODIFICATION AND METHOD FOR DETECTING NUCLEIC ACID MODIFICATION USING THE SAME SAMPLE NUCLEIC ACID

METHOD FOR PRODUCING SAMPLE NUCLEIC ACID FOR ANALYZING NUCLEIC ACID MODIFICATION AND METHOD FOR DETECTING NUCLEIC ACID MODIFICATION USING THE SAME SAMPLE NUCLEIC ACID

机译:生产用于分析核酸修饰的样品核酸的方法和使用相同样品核酸检测核酸修饰的方法

摘要

PPROBLEM TO BE SOLVED: To provide a method for analyzing nucleic acid modification by which the analysis can be carried out with smaller amounts of samples than conventional methods and to further provide a method for analyzing a specific site of the genome without requiring complicated operation. PSOLUTION: The method for producing the sample nucleic acids for analyzing nucleic acid modification is provided. The method comprises preparing for a nucleic acid to be the object of detection, dividing the prepared nucleic acid into two groups of a first nucleic acid group and a second nucleic acid group, demodifying the nucleic acid of the first nucleic acid group, carrying out bisulfite modification of the first nucleic acid group and the second nucleic acid group, respectively, performing random amplification of the nucleic acid of each of the groups obtained by the bisulfite modification with a random primer set under amplifiable conditions and providing an amplification product from the first nucleic acid group and an amplification product from the second nucleic acid group as the sample nucleic acids for the genomic analysis. PCOPYRIGHT: (C)2008,JPO&INPIT
机译:<要解决的问题:提供一种分析核酸修饰的方法,通过该方法可以用比常规方法更少的样品量进行分析,并且还提供了一种无需复杂的分析基因组特定位点的方法操作。

解决方案:提供了用于分析核酸修饰的样品核酸的生产方法。该方法包括制备核酸作为检测对象,将制备的核酸分为第一核酸基团和第二核酸基团的两个组,将第一核酸基团的核酸脱模,进行亚硫酸氢盐。分别对第一核酸基团和第二核酸基团进行修饰,在可扩增的条件下用随机引物对通过亚硫酸氢盐修饰获得的每个基团的核酸进行随机扩增,并提供来自第一核酸的扩增产物核酸基团和来自第二核酸基团的扩增产物作为用于基因组分析的样品核酸。

版权:(C)2008,日本特许厅&INPIT

著录项

  • 公开/公告号JP2007295855A

    专利类型

  • 公开/公告日2007-11-15

    原文格式PDF

  • 申请/专利权人 TOPPAN PRINTING CO LTD;

    申请/专利号JP20060127074

  • 发明设计人 ASAI RYOICHI;

    申请日2006-04-28

  • 分类号C12Q1/68;C12N15/09;

  • 国家 JP

  • 入库时间 2022-08-21 20:23:44

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