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The high high election mobility transistor which is produced from layer of the 13th family element nitride (HEMT) and its production method

机译:由第十三族元素氮化物层制造的高高迁移率晶体管及其制造方法

摘要

The invention relates to a new High Electron Mobility Transistor (HEMT), made essentially of layers of Group XIII element(s) nitride(s). Contrary to currently available transistors of this type, the transistor according to the invention is produced on a homosubstrate made of gallium-containing nitride, has no nucleation layer and its buffer layer is remarkably thinner than in known HEMTs. Preferably, at least the buffer layer, being a part of the transistor according to the present invention, is produced by epitaxial methods and the direction of growth of said layer in an epitaxial process is essentially perpendicular to the direction of growth of the substrate. The invention relates also to a method of manufacturing of High Electron Mobility Transistor (HEMT).
机译:本发明涉及一种新的高电子迁移率晶体管(HEMT),其基本上由第XIII族元素氮化物的层制成。与目前可用的这种类型的晶体管相反,根据本发明的晶体管在由含镓氮化物制成的均质衬底上制造,不具有成核层,并且其缓冲层比已知的HEMT中的厚度明显薄。优选地,至少缓冲层是根据本发明的晶体管的一部分,是通过外延方法制造的,并且所述层在外延工艺中的生长方向基本上垂直于衬底的生长方向。本发明还涉及高电子迁移率晶体管(HEMT)的制造方法。

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