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Optical recording medium, film thickness measuring method of the optical recording medium, film thickness control method and the production method

机译:光学记录介质,光学记录介质的膜厚测量方法,膜厚控制方法和生产方法

摘要

PPROBLEM TO BE SOLVED: To easily measure the film thickness of a translucent reflection layer by a transmission method, in an optical recording medium wherein an another layer such as a recording layer is provided between a substrate and the translucent reflection layer. PSOLUTION: In the optical recording medium provided with another layer (such as the recording layer 2) between the light transmissive substrate 1 and the translucent reflection layer 3, the region of the translucent reflection layer 3 is formed so as to be wider than the region of the another layer by prescribed regions WSB1/SB' and WSB2/SB' to measure the film thickness of the translucent reflection layer 3 by the transmission method in the prescribed regions WSB1/SB' and WSB2/SB'. PCOPYRIGHT: (C)2005,JPO&NCIPI
机译:

要解决的问题:为了通过透射法容易地测量半透明反射层的膜厚,在光学记录介质中,其中在基板和半透明反射层之间设置有诸如记录层的另一层。

解决方案:在透光基板1和半透明反射层3之间设有另一层(例如记录层2)的光记录介质中,半透明反射层3的区域形成得更宽。相对于另一层的区域的规定区域W 1 '和W 2 ',通过透射法在规定区域中测定透光性反射层3的膜厚W 1 '和W 2 '。

版权:(C)2005,JPO&NCIPI

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