首页> 外国专利> Formation method of contact pin, probe, contact pin, production method of probe card and probe card

Formation method of contact pin, probe, contact pin, production method of probe card and probe card

机译:触针,探针,触针的形成方法,探针卡和探针卡的制造方法

摘要

Be able to form easily, you install and the probe where position and number cannot be restricted, still can guarantee the movable space of the contact sufficiently is offered. The probe has with the beam section which supports the contact and the particular contact in order to make the suffering inspection body contact in the point. The rear section of the beam section of the probe is connected to the surface of suffering inspection body side of the contacter which it is opposed is arranged in the suffering inspection body. The beam section of the probe has been crooked, in order for the aforementioned contact of the point to tilt on the aforementioned suffering inspection body side.
机译:能够轻松地形成,安装和位置和数量不受限制的探头,仍可以确保充分提供触点的可移动空间。探针具有梁部分,该梁部分支撑接触点和特定的接触点,以使受害检查体在该点上接触。探针的梁部的后部与被配置在患病检查体中的与之相对的接触器的患病检查体侧的表面连接。为了使该点的上述接触在上述受害检查体侧倾斜,探针的光束部分已经弯曲。

著录项

  • 公开/公告号JPWO2006095759A1

    专利类型

  • 公开/公告日2008-08-14

    原文格式PDF

  • 申请/专利权人 東京エレクトロン株式会社;

    申请/专利号JP20060533383

  • 发明设计人 保坂 久富;

    申请日2006-03-08

  • 分类号G01R1/067;G01R1/073;H01L21/66;

  • 国家 JP

  • 入库时间 2022-08-21 20:18:00

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