首页> 外文学位 >Analysis of non-contact and contact probe-to-sample thermal exchange for quantitative measurements of thin film and nanostructure thermal conductivity by the scanning hot probe method.

【24h】

Analysis of non-contact and contact probe-to-sample thermal exchange for quantitative measurements of thin film and nanostructure thermal conductivity by the scanning hot probe method.

机译：通过扫描热探针法对非接触式和接触式探针与样品之间的热交换进行分析，以定量测量薄膜和纳米结构的热导率。

获取原文

获取原文并翻译 | 示例

页面导航

著录项
相似文献
相关主题

著录项

作者
Wilson, Adam A.;
展开▼
作者单位

Rensselaer Polytechnic Institute.;

展开▼
授予单位 Rensselaer Polytechnic Institute.;
学科 Mechanical engineering.;Materials science.
学位 Ph.D.
年度 2017
页码 271 p.
总页数 271
原文格式 PDF
正文语种 eng
中图分类
关键词
入库时间 2022-08-17 11:37:13

相似文献

外文文献
中文文献
专利

1. Thermal conductivity of thin film-substrate systems from two-side scanning photothermal deflection measurements: Theoretical model and validation [J] . Kazemian Sina, Bazylewski Paul, Bauld Reg, The Journal of Chemical Physics . 2019,第18期

机译：两侧扫描光热偏转测量的薄膜基板系统的导热系数：理论模型和验证
2. Application of scanning thermal microscopy for thermal conductivity measurements on meso-porous silicon thin films [J] . Gome S, David L, Lysenko V, Journal of Physics, D. Applied Physics: A Europhysics Journal . 2007,第21期

机译：扫描热显微镜在介孔硅薄膜热导率测量中的应用
3. Thermal Conductivity Measurements of Thin Amorphous Silicon Films by Scanning Thermal Microscopy [J] . S. Volz, X. Feng, C. Fuentes, International Journal of Thermophysics . 2002,第6期

机译：扫描热显微镜测量非晶硅薄膜的热导率
4. Determination of Thermal Conductivity of Amorphous Silicon Thin Films via Non-Contacting Optical Probing [C] . Seung-Jae Moon International Conference on Experimental Mechanics(ICEM 2006);Asian Conference on Experimental Mechanics(ACEM5); 20060926-29;20060926-29; Jeju(KR);Jeju(KR) . 2006

机译：非接触光学探针法测定非晶硅薄膜的导热系数
5. Thermal conductivity measurements of bulk materials and thin films by the 3o method. [D] . Liske, Romy. 2005

机译：通过3o方法测量散装材料和薄膜的热导率。
6. Scanning Thermal Microscopy of Ultrathin Films: Numerical Studies Regarding Cantilever Displacement Thermal Contact Areas Heat Fluxes and Heat Distribution [O] . Christoph Metzke, Fabian Kühnel, Jonas Weber, 2021

机译：超薄薄膜扫描热显微镜：关于悬臂位移热接触区域热通量和热分布的数值研究
7. Thermal conductivity measurements of high and low thermal conductivity films using a scanning hot probe method in the 3ω mode and novel calibration strategies [O] . Wilson Adam Andrew, Muñoz Rojo Miguel, Abad Mayor Begoña, 2016

机译：使用3ω模式的扫描热探针法和新颖的校准策略测量高和低导热率薄膜的导热率
8. Measurement of the Thermal Conductivity of Dielectric Thin Solid Films with a Thermal Comparator [R] . Amsden, C. A. , Gilman, S. E. , Jacobs, S. D. , 1988

机译：用热比较仪测量介电薄膜固体薄膜的导热系数

Analysis of non-contact and contact probe-to-sample thermal exchange for quantitative measurements of thin film and nanostructure thermal conductivity by the scanning hot probe method.

著录项

相似文献

相关主题

期刊订阅