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High rate, continuous deposition of high quality amorphous, nanocrystalline, microcrystalline or polycrystalline materials

机译:高速率,连续沉积高质量的非晶,纳米晶体,微晶或多晶材料

摘要

An apparatus and a method for high rate deposition of thin film materials. The method including the steps of (1) generating a supply of activated species from an energy transferring gas, through the use of a plasma; (2) separating the charged species from the non-charged species of the activated species (optionally through the use of an electrically biased screen or mesh), (3) transporting the non-charged species to a collision region (through the use of the substantial pressure differential and transonic velocity of the energy transferring gas); (4) introducing a precursor deposition feedstock gas into the collision region and; (5) producing large quantities of desirable deposition species within said collision region via the collision of non-charged species of said energy transferring gas with molecules within the precursor deposition feedstock gas; and (6) depositing, at a high deposition rate, quality thin film material onto a substrate which is adjacent to the collision. The apparatus will allow for the formation of a filtered, neutralized plasma from which non-single crystal semiconductors having fewer than 5.0×1014/cm3 subgap defects.
机译:用于高速沉积薄膜材料的设备和方法。该方法包括以下步骤:(1)通过使用等离子体从能量转移气体产生活化物质的供给; (2)将带电物种与活化物种的非带电物种分开(可选地通过使用电偏压滤网或网格),(3)将非带电物种运输到碰撞区域(通过使用能量传递气体的显着压差和跨音速); (4)将前驱物沉积原料气引入到碰撞区域中;以及(5)通过所述能量转移气体的不带电物质与前驱物沉积原料气中的分子的碰撞,在所述碰撞区域中产生大量期望的沉积物质; (6)以高沉积速率将高质量的薄膜材料沉积到与碰撞相邻的基板上。该设备将允许形成过滤的中和的等离子体,从该等离子体中,具有小于5.0×10 14 / cm 3 subgap缺陷的非单晶半导体。

著录项

  • 公开/公告号US2008090022A1

    专利类型

  • 公开/公告日2008-04-17

    原文格式PDF

  • 申请/专利权人 STANFORD R. OVSHINSKY;

    申请/专利号US20060546619

  • 发明设计人 STANFORD R. OVSHINSKY;

    申请日2006-10-12

  • 分类号C23C16/00;H05H1/24;

  • 国家 US

  • 入库时间 2022-08-21 20:16:02

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