首页> 外国专利> AN APPARATUS AND METHOD FOR MEASURING AND MONITORING COMPLEX PERMITTIVITY OF MATERIALS.

AN APPARATUS AND METHOD FOR MEASURING AND MONITORING COMPLEX PERMITTIVITY OF MATERIALS.

机译:一种用于测量和监测材料的复介电常数的装置和方法。

摘要

TITLE: AN APPARATUS AND METHOD FOR MEASURING AND MONITORING COMPLEX PERMITTIVITY OF MATERIALS. An instrument for the measurement of complex permitivity of dielectric materials in solid, liquid and semisolid state comprising: a microwave resonator selected from the group of transmission and reflection reasonators, said microwave resonator having a resonator surface; a microwave sweep oscillator, the putput of which is coupled to the microwave resonator; a detector associated with the microwave resonator for detecting a frequency shift and a q factor of the microwave resonator; means for coupling power to and fromt he microwave resonator; means for measuring the power supplied to and received from the microwave resonator; a computer interfaced with a system with components including the microwave sweep osicllator, the microwave resonator, the detector and the means for measuring the power; electromagnetic software for the analysis of complex permitivity of the dielectric materials; and an inerfacing software for communication between components of the system and the computer.
机译:标题:一种用于测量和监测材料的复杂介电常数的装置和方法。一种用于测量固态,液态和半固态介电材料的复介电常数的仪器,包括:微波谐振器,选自透射和反射原因器,所述微波谐振器具有谐振器表面;以及微波扫频振荡器,其输出耦合到微波谐振器;与微波谐振器相关的检测器,用于检测微波谐振器的频率偏移和q因子;用于将功率耦合到微波谐振器和从微波谐振器来回耦合的装置;用于测量提供给微波谐振器和从微波谐振器接收的功率的装置;与系统连接的计算机,该系统的组件包括微波扫频振荡器,微波谐振器,检测器和功率测量装置;电磁软件,用于分析介电材料的复介电常数;以及用于在系统组件和计算机之间进行通信的接口软件。

著录项

  • 公开/公告号IN214266B

    专利类型

  • 公开/公告日2008-02-08

    原文格式PDF

  • 申请/专利权人

    申请/专利号IN540/CAL/1999

  • 发明设计人 KALPANA GHOSH;

    申请日1999-06-11

  • 分类号G01N22/04;G01N22/00;

  • 国家 IN

  • 入库时间 2022-08-21 20:07:15

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