The present invention relates to a method for measuring high frequency intrinsic surface resistance of a superconductor, comprising: a first step of measuring a Q-factor of a dielectric resonator using a separate network analyzer; A second step of determining the effective surface resistance of the superconductor and the loss tangent of the dielectric using the Q-factor value of the dielectric resonator measured in the first step; A third step of measuring a superconducting electromagnetic wave penetration depth in a state in which only the temperature of the superconductor placed on the upper surface of the dielectric resonator and the temperature of the dielectric can be changed while maintaining a constant temperature; And a fourth step of calculating the intrinsic surface resistance of the superconductor using the effective surface resistance of the superconductor determined in the second step and the superconducting electromagnetic wave penetration depth measured in the third step. It includes.;Superconductor, Intrinsic Surface Resistance, Dielectric, Loss Tangent
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