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Method for measuring the intrinsic surface impedance of superconducting materials in the microwave region

机译:微波区域超导材料本征表面阻抗的测量方法

摘要

The present invention relates to a method for measuring high frequency intrinsic surface resistance of a superconductor, comprising: a first step of measuring a Q-factor of a dielectric resonator using a separate network analyzer; A second step of determining the effective surface resistance of the superconductor and the loss tangent of the dielectric using the Q-factor value of the dielectric resonator measured in the first step; A third step of measuring a superconducting electromagnetic wave penetration depth in a state in which only the temperature of the superconductor placed on the upper surface of the dielectric resonator and the temperature of the dielectric can be changed while maintaining a constant temperature; And a fourth step of calculating the intrinsic surface resistance of the superconductor using the effective surface resistance of the superconductor determined in the second step and the superconducting electromagnetic wave penetration depth measured in the third step. It includes.;Superconductor, Intrinsic Surface Resistance, Dielectric, Loss Tangent
机译:本发明涉及一种用于测量超导体的高频固有表面电阻的方法,该方法包括:使用单独的网络分析仪测量介电谐振器的Q因子的第一步;第二步,使用第一步中测得的介质谐振器的Q值确定超导体的有效表面电阻和介质的损耗角正切。第三步骤是在保持恒温的状态下,仅改变放置在电介质谐振器上表面的超导体的温度和电介质的温度的状态下,测量超导电磁波的穿透深度。第四步骤是使用第二步骤中确定的超导体的有效表面电阻和第三步骤中测量的超导电磁波穿透深度来计算超导体的本征表面电阻。它包括:;超导体,本征表面电阻,介电常数,损耗角正切

著录项

  • 公开/公告号KR100775859B1

    专利类型

  • 公开/公告日2007-11-13

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20050027243

  • 发明设计人 이상영;이재훈;

    申请日2005-03-31

  • 分类号G01R27;

  • 国家 KR

  • 入库时间 2022-08-21 19:54:40

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