首页> 外国专利> METHOD FOR GUESSING SURFACE RESISTANCE OF SUPERCONDUCTIVE FILM, METHOD FOR GUESSING SURFACE IMPEDANCE OF SUPERCONDUCTIVE FILM, METHOD FOR GUESSING Q-VALUE OF SUPERCONDUCTIVE THIN FILM RESONANCE CIRCUIT, DEVICE FOR GUESSING SURFACE RESISTANCE OF SUPERCONDUCTIVE FILM, AND METHOD FOR MANUFACTURING SUPERCONDUCTIVE DETECTOR

METHOD FOR GUESSING SURFACE RESISTANCE OF SUPERCONDUCTIVE FILM, METHOD FOR GUESSING SURFACE IMPEDANCE OF SUPERCONDUCTIVE FILM, METHOD FOR GUESSING Q-VALUE OF SUPERCONDUCTIVE THIN FILM RESONANCE CIRCUIT, DEVICE FOR GUESSING SURFACE RESISTANCE OF SUPERCONDUCTIVE FILM, AND METHOD FOR MANUFACTURING SUPERCONDUCTIVE DETECTOR

机译:一种超导薄膜的表面电阻的测量方法,一种超导薄膜的表面电阻的测量方法,一种超薄薄膜共振电路的Q值的测量方法,一种用于超导薄膜的超导体的表面电阻的测量方法以及一种方法

摘要

PROBLEM TO BE SOLVED: To provide a method or the like for guessing a surface resistance of a superconductive film, the method guessing a surface resistance of a superconductive film in higher accuracy.;SOLUTION: In the method for guessing a surface resistance of a superconductive film, a gap energy is represented in a complex number to guess a surface resistance of a superconductive film using a Mattis-Bardeen equation. A method for guessing a surface resistance of a superconductive film in higher accuracy can be obtained according to the constitution. In the method for guessing a surface impedance of a superconductive film, a gap energy is represented in a complex number to guess a surface impedance of a superconductive film using a Mattis-Bardeen equation and a transmission loss of a high-frequency transmission line made of the superconductive film is guessed by using the value. A method for guessing a surface impedance of a superconductive film in higher accuracy can be obtained according to the constitution.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:为了提供一种推测超导膜的表面电阻的方法等,该方法以更高的准确度推测超导膜的表面电阻;解决方案:在推测超导膜的表面电阻的方法中在膜中,间隙能量用复数表示,以使用Mattis-Bardeen方程猜测超导膜的表面电阻。根据该构成,可以得到以更高的精度推测超导膜的表面电阻的方法。在推测超导膜的表面阻抗的方法中,间隙能量以复数表示,以利用马蒂斯-巴登(Matis-Bardeen)方程和由其构成的高频传输线的传输损耗来推测超导膜的表面阻抗。使用该值可以猜测超导膜。根据该构造,可以获得一种更高精度地推测超导膜的表面阻抗的方法。版权所有:(C)2011,日本特许厅&INPIT

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