Measurement method of microwave surface resistance of high T-c superconductive thin films

摘要

A measurement system for characterization of microwave surface resistance of HTS thin films is presented. In this system, a high Q factor sapphire resonator probe with TE011+delta mode was developed to measure the surface resistance R-s of a single piece of HTS thin film at 12 GHz and 77 K. The size of HTS films can be equal to about 2 in. The method has advantages of nondestructivity, single sample, high Q value, high sensitivity, convenient experiment setup, small volume, and flexibility in operation. (C) 2002 Published by Elsevier Science B.V. [References: 8]