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首页> 外文期刊>低温工学 >Construction of low-loss sapphire resonators for Precise Measurements of the Microwave surface resistance of high T_c superconducting thin films
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Construction of low-loss sapphire resonators for Precise Measurements of the Microwave surface resistance of high T_c superconducting thin films

机译:低损耗 蓝宝石 谐振器 为 高 T_C 超导 薄膜的 微波 表面电阻 的精确测量 的构建

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摘要

We have constructed a microwave resonator module using high T_c superconducting (HTS)thin films and a dielectric saphire rod to measure microwave surface resistances of the HTS thin films.In this method the surface resistance is calculated from the measured unloaded Q values of the resonator.For precise measurements of surface resistance,therefore,the microwave loss not generated by HTS thin filme must be minimized.By reducting the parastic Q factors of the resonator module,we obtained Q values of as high as 1.2X10~7 AT 17.3K and 12GHz.From the high Q values measured in this improved resonator,the surface resistance of the YBa_2Cu_3O_y superconducting thin films on MgO substrates was calculated and found to be 0.064mohm at 20.2 K and 12GH_z.
机译:我们使用高T_C超导(HTS)薄膜和电介质示波器杆构成了微波谐振器模块,以测量HTS薄膜的微波表面电阻。该方法从谐振器的测量卸载Q值计算表面电阻。 因此,对于表面电阻的精确测量,必须最小化未通过HTS薄膜产生的微波损耗。通过减少谐振器模块的自拍Q因子,我们获得了17.3k和12GHz的高达1.2x10〜7的Q值 。从该改进的谐振器中测量的高Q值,计算MgO衬底上的YBA_2Cu_3O_y超导薄膜的表面电阻,并发现为20.2k和12gh_z的0.064mOHM。

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