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METHOD OF MANUFACTURING A PHASE CHANGEABLE MEMORY CELL HAVING A BUFFER PATTERN IN A DATA STORAGE ELEMENT AND PHASE CHANGEABLE MEMORY MANUFACTURED THEREBY
METHOD OF MANUFACTURING A PHASE CHANGEABLE MEMORY CELL HAVING A BUFFER PATTERN IN A DATA STORAGE ELEMENT AND PHASE CHANGEABLE MEMORY MANUFACTURED THEREBY
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机译:制造在数据存储元件中具有缓冲模式的相变存储器单元的方法及其由此制造的相变存储器
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摘要
A method for fabricating a phase change memory cell having a buffer pattern in a data storage element is provided to reduce reset current by decreasing the stress applied to the phase change material pattern by a buffer pattern. A first electrode(150) is formed on a semiconductor substrate(110). A data storage element(166) is formed on the first electrode, including a phase change material pattern, an insulation layer pattern and a buffer pattern that are sequentially stacked. A second electrode(174) is formed on the sidewall and upper surface of the data storage element. The process for forming the second electrode can include the following steps. A horizontal electrode(170) is formed to cover the upper surface of the data storage element. The sidewalls of the data storage element and the horizontal electrode are covered with a vertical electrode(172).
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