首页> 外国专利> METHOD OF MANUFACTURING A PHASE CHANGEABLE MEMORY CELL HAVING A BUFFER PATTERN IN A DATA STORAGE ELEMENT AND PHASE CHANGEABLE MEMORY MANUFACTURED THEREBY

METHOD OF MANUFACTURING A PHASE CHANGEABLE MEMORY CELL HAVING A BUFFER PATTERN IN A DATA STORAGE ELEMENT AND PHASE CHANGEABLE MEMORY MANUFACTURED THEREBY

机译:制造在数据存储元件中具有缓冲模式的相变存储器单元的方法及其由此制造的相变存储器

摘要

A method for fabricating a phase change memory cell having a buffer pattern in a data storage element is provided to reduce reset current by decreasing the stress applied to the phase change material pattern by a buffer pattern. A first electrode(150) is formed on a semiconductor substrate(110). A data storage element(166) is formed on the first electrode, including a phase change material pattern, an insulation layer pattern and a buffer pattern that are sequentially stacked. A second electrode(174) is formed on the sidewall and upper surface of the data storage element. The process for forming the second electrode can include the following steps. A horizontal electrode(170) is formed to cover the upper surface of the data storage element. The sidewalls of the data storage element and the horizontal electrode are covered with a vertical electrode(172).
机译:提供一种用于制造在数据存储元件中具有缓冲图案的相变存储单元的方法,以通过减小通过缓冲图案施加到相变材料图案上的应力来减小复位电流。在半导体衬底(110)上形成第一电极(150)。数据存储元件(166)形成在第一电极上,包括依次堆叠的相变材料图案,绝缘层图案和缓冲图案。在数据存储元件的侧壁和上表面上形成第二电极(174)。形成第二电极的工艺可以包括以下步骤。形成水平电极(170)以覆盖数据存储元件的上表面。数据存储元件和水平电极的侧壁被垂直电极(172)覆盖。

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