SYSTEM AND EMBEDDED CIRCUIT FOR BUILT-IN SELF REPAIR AND BUILT-IN SELF TEST AND METHOD THEREOF

摘要

An embedded memory device and a system integrated with a programmable self-test, and a self-recovery method thereof are provided to detect a new fault model as well as a usual fault model capable of providing transparency to a user and apply more various algorithms selectively according to stabilization of a memory manufacturing process. An embedded memory(20) stores data and outputs the stored data. An algorithm generator(10) selects and outputs one of a plurality of algorithms by responding to a selection signal received from the outside. A test controller(50) detects a region including a fault by testing the embedded memory with the algorithm output from the algorithm generator. The test controller includes an address generator(80) increasing or decreasing an address of the embedded memory to be tested by receiving the MSB(Most Significant Bit) among a code received from the algorithm generator, a signal generator(70) generating a control signal for testing read/write operations of the embedded memory by receiving the remaining part of the code, and a comparator(60) determining the fault by comparing the data output from the embedded memory with reference data.